LITOS - Stress-Test Platform for Degradation Analysis of LEDs
Overview
Litos is an advanced LED stability lifetime measurement system. It has 16, or 32 parallel stressing channels distributed over 4 chambers. The wide range of stress conditions and the possibility of interfacing Litos with Paios for in-depth degradation analysis, make it a primary choice for researchers that want to understand the degradation behaviour of organic, perovskite, and quantum-dots-based LEDs.
Litos/Paios Integration
Paios and Litos can be connected and managed by the same software (Characterization Suite). In OLEDs, the simple luminance decay over time or steady-state analysis is not sufficient to draw meaningful conclusions. A more systematic strategy comprising a wider spectrum of experimental techniques is therefore required. A full characterization of the device during degradation can be performed automatically by combining Paios with Litos:
Advantages
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16, or 32 individual channels to address multiple LEDs in parallel.
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4 chambers with individual humidity sensors.
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Design customized to the specific sample layout of the customer.
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The Litos-Paios Integration provides a unique tool to study degradation mechanisms in LEDs.
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User-friendly software for automatic measurement control and parameter extraction.
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Stressing at constant current, and constant voltage
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Compatible with Bottom and Top Emitting LEDs (1 chamber with either BT/TP photodetectors)
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Individual photodiode for each LED under test (optical separation not possible).
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Temperature control of the individual sample 0 – 85 °C.
